Statistical Thinking to Improve Quality

This posting discusses the use of process capability indices in fifth step, Evaluate Capability, of the Hoerl-Snee Process Improvement Strategy.   Refer to the figure in the April 4 posting for an overview of the process.    See Hare (2007) or Breyfogle (2003) for references.

The following figures illustrate two problems with the C_pk index.
1.     In the first figure, two processes with identical C_pk values (1.5) have significantly different means and standard deviations.  Possibly changing the mean is easier to accomplish than the standard deviation.
2.     In the second figure, two processes with identical C_pk values (1.0) have different distributions.   One is normal and the other lognormal.  For the normal distribution, the probability of being below the lower spec limit is .00135, and the probability of exceeding the upper spec limit has the same value.   For the normal distribution, the total probability of not meeting the spec limit is .0027.   For the lognormal distribution, the probability of the quality measure being below the lower spec limit is approximately zero, while the probability of being greater than the upper spec limit is .007915.   For the lognormal, the probability of not meeting the spec limits is almost three times the corresponding value for the normal distribution.

For the above reasons and others, Breyfogle (2003) recommends the use of estimated parts per million (ppm) beyond specification limits rather than process capability estimates.

Due to sampling variability, Hare (2007) recommends estimating process capability indices using at least 100 values.

Reference

1. Hare, Lynne B. (2007).  “The Ubiquitous C_pk”, Quality Progress, pp. 72-73.
2. Breyfogle III, Forrest W. (2003). Implementing Six Sigma – Smarter Solutions^â Using Statistical Methods, John Wiley & Sons, Inc., pp 296-299.